Complex system test time automatic statistics method and system

• Main Authors: CHEN HUA, HE YUBIN, WANG WENYAN, WAN BEI, DU YAOKE, WANG JIAYI, WANG YU, LIU MEISHI, WU JINGYU, CUI JIA
• Format: Patent
• Language: Chinese; English
• Published: 07.07.2020
• Subjects: CONTROL OR REGULATING SYSTEMS IN GENERAL; CONTROLLING; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS; PHYSICS; REGULATING

The invention discloses a complex system test time automatic statistics method and system, and the method comprises the following steps: building a semi-physical simulation test system; sending a teststart time stamp to a time statistics system; sending the working timestamp of the star sensor to a...