Image inspection apparatus

• Main Author: KAWAI MUNEAKI
• Format: Patent
• Language: Chinese; English
• Published: 26.06.2020
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention provides an image inspection apparatus. The image inspection apparatus is capable of inspecting an image of an object to be inspected with high accuracy while conveying a printing paper(P) from an upstream conveying unit to a downstream conveying unit. An image inspection apparatus (1) inspects the printing paper (P) conveyed by a first conveying unit (11) of a printing device (2) at a first conveying speed (V1) by using a second conveying unit (12) of an inspection device (3) while inspecting the printing paper (P) by using a first inspection unit (21). The first inspection unit (21) is disposed at a position where a distance between a downstream side and an intermediate position (C) between the first conveyance unit and the second conveyance unit is a dimension (L1) that exceeds half of a length of the printing paper. Even if V1 and V2 are substantially different, since the inspection start timing of the first inspection unit is after the conveyance speed of the printing paper becomes V2, the