Method for testing thermal parameters of non-uniform structure

• Main Authors: YE SHULIANG, HOU DEXIN
• Format: Patent
• Language: Chinese; English
• Published: 05.06.2020
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a method suitable for testing thermal parameters of a non-uniform structure, especially the non-uniform structure formed by connecting and combining a plurality of components,such as a lithium battery module. According to the method, a to-be-tested sample is placed in a const...