Test fixture with sintered connections between mother board and daughter board

• Main Author: NEWBY RANDAL LERAY
• Format: Patent
• Language: Chinese; English
• Published: 24.04.2020
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A test fixture (120) includes a mother board (225) that has test signal lines (223) configured to couple (651) to a test station (650). The mother board (225) includes a recessed region with contact pads (428) coupled to the test signal lines (223). A daughter board (230) is engaged with the recessed region such that a top surface of the daughter board (230) is approximately coplanar with a top surface of the mother board (225). The daughter board (230) includes test signal lines coupled to contact pads (638) on the daughter board (230). The contact pads (638) on the daughter board (230) alignwith the contact pads (428) on the mother board (225) and are permanently coupled by sintered bonds (640). 测试夹具(120)包括具有测试信号线(223)的母板(225)，该测试信号线(223)被配置为耦合(651)到测试站(650)。母板(225)包括具有接触焊盘(428)的凹陷区域，该接触焊盘(428)耦合到测试信号线(223)。子板(230)与凹陷区域接合，使得子板(230)的顶表面与母板(225)的顶表面大致共面。子板(230)包括测试信号线，该测试信号线耦合到子板(230)上的接触焊盘(638)。子板(230)上的接触焊盘(638)与母板(225)上的接触焊盘(428)对准，并通过烧结键合(640)永久耦合。