SYSTEMS, METHODS AND DEVICES FOR WIDTH-BASED ANALYSIS OF PEAK TRACES

• Main Authors: SRINIVASAN KANNAN, DASGUPTA PURNENDU, KADJO AKINDE F
• Format: Patent
• Language: Chinese; English
• Published: 13.09.2019
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

Systems, methods and devices are taught for providing analytical methods for peak-shaped responses separated in time or space, including quantitation of chromatographic peaks based on a width measurement of a peak trace at a selected height as a quantitation element. Methods of treating a peak trace as a composition of exponential functions representing a leading and a trailing end are included. Methods that facilitate the detection of impurities in peak trace outputs are also included. 教导了用于提供在时间或空间上分离的峰形响应的分析方法的系统、方法和装置，包含基于在作为定量元素的选定高度处的峰迹线的宽度测量的色谱峰定量。包含了将峰迹线处理为表示前端和后端的指数函数的组合的方法。还包含了有助于检测峰迹线输出中的杂质的方法。