一种基于测量轨迹的阈值直线确定方法、装置

• Format: Patent
• Language: Chinese
• Published: 25.04.2023
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

本发明属于量子测控领域，具体公开了一种基于测量轨迹的阈值直线确定方法、装置，包括：获得量子比特处于确定量子态时的量子比特读取信号的测量数据，对所述测量数据进行复数变换处理获得量子比特处于确定量子态时的量子比特读取信号对应的原始数据；根据所述原始数据获得量子比特读取信号对应的测量轨迹；根据所述测量轨迹获得第一类坐标点数据、第一统计中心坐标点、第二类坐标点数据、第二统计中心坐标点；根据所述第一类坐标点数据和所述第一统计中心坐标点、第二类坐标点数据和所述第二统计中心坐标点确定阈值直线。本发明能够提高数据的预处理精度以及获得的阈值直线精度，有助于提高量子计算系统的可靠性和稳定性。 The invention belongs to the field of quantum measurement and control, and specifically discloses a threshold straight line determination method and device based on a measurement track. The thresholdstraight line determination method comprises the following steps: obtaining measurement data of a quantum bit reading signal when a quantum bit is in a determined quantum state, and carrying out complex number transformation processing on the measurement data to obtain original data corresponding to the quantum bit reading signal when the quantum bit is in the determined quantum state; obtaining ameasurement track corresponding to the quantum bit reading signal according to the original data; obtaining a first type of coordinate