Non-contact temperature measuring and rotating speed measuring integrated analyzer

• Main Author: DENG XUEYONG
• Format: Patent
• Language: Chinese; English
• Published: 14.06.2019
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; MEASURING; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; PHYSICS; TARIFF METERING APPARATUS; TESTING

The invention discloses a non-contact temperature measuring and rotating speed measuring integrated analyzer, and relates to the technical field of measurement facilities. The non-contact temperaturemeasuring and rotating speed measuring integrated analyzer comprises a shell and a lamp band circuit board base. The bottom of the inner wall of the shell is fixedly connected with the bottom of the lamp band circuit board base, the shell is internally and fixedly connected with a control unit, a rotating speed sensor and an infrared temperature sensor separately, and a laser sensor is fixedly connected into the shell and located between the control unit and the rotating speed sensor. The non-contact temperature measuring and rotating speed measuring integrated analyzer collects and controls aplurality of parameters to synchronously calculate and synchronously output strobe through one chip, the combination of infrared temperature measuring and rotating speed measuring is realized, the measuring rotating speed can