DEVICE FOR MEASURING STAVE THICKNESS

• Main Authors: JANG SOO-HO, YOO BYEONG-SOO, KIM KWAN-TAE, SHIN NAM-HO, CHOI SANG-WOO
• Format: Patent
• Language: Chinese; English
• Published: 26.04.2019
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The present invention relates to a device for measuring a stave thickness, comprising: a main body through which an operation rod passes; a link part for connecting the main body and one end of the operation rod; and a sensor part provided at one side of the link part so as to move according to the...