Fragment multi-parameter testing device and method based on regional PVDF (Polyvinylidene Fluoride) piezoelectric film
The invention discloses a fragment multi-parameter testing device and method based on a regional PVDF (Polyvinylidene Fluoride) piezoelectric film. The testing device comprises a first regional PVDF piezoelectric film, a second regional PVDF piezoelectric film, a signal collection module and an uppe...
Saved in:
Main Authors | , |
---|---|
Format | Patent |
Language | Chinese English |
Published |
05.02.2019
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | The invention discloses a fragment multi-parameter testing device and method based on a regional PVDF (Polyvinylidene Fluoride) piezoelectric film. The testing device comprises a first regional PVDF piezoelectric film, a second regional PVDF piezoelectric film, a signal collection module and an upper computer, wherein a set distance is formed between the first regional PVDF piezoelectric film andthe second regional PVDF piezoelectric film; the two piezoelectric films independently consist of a plurality of piezoelectric measurement units formed by regional division; the input end of the signal collection module is independently connected with the first regional PVDF piezoelectric film and the second regional PVDF piezoelectric film; the output end of the signal collection module is connected with the upper computer; the upper computer obtains fragment speed according to time and set distance for a fragment to pass through the first regional PVDF piezoelectric film and the second regional PVDF piezoelectric fi |
---|---|
AbstractList | The invention discloses a fragment multi-parameter testing device and method based on a regional PVDF (Polyvinylidene Fluoride) piezoelectric film. The testing device comprises a first regional PVDF piezoelectric film, a second regional PVDF piezoelectric film, a signal collection module and an upper computer, wherein a set distance is formed between the first regional PVDF piezoelectric film andthe second regional PVDF piezoelectric film; the two piezoelectric films independently consist of a plurality of piezoelectric measurement units formed by regional division; the input end of the signal collection module is independently connected with the first regional PVDF piezoelectric film and the second regional PVDF piezoelectric film; the output end of the signal collection module is connected with the upper computer; the upper computer obtains fragment speed according to time and set distance for a fragment to pass through the first regional PVDF piezoelectric film and the second regional PVDF piezoelectric fi |
Author | WANG XUANQUAN SONG PING |
Author_xml | – fullname: SONG PING – fullname: WANG XUANQUAN |
BookMark | eNqNjLsKwkAQRVNo4esfxk4LIRJELCUarCSF2IY1exMHNrPLZhOIX28KP8DqHjiHO48mYgWzqM-8qhtIoKYzgXdOedUgwFNAG1hq0ui5BCnRNIq31fRSLTRZIY-arShD-fOS0Sa3ZuhZBsMaAspMZ_2IW3KMj4VBGTyXVLFpltG0UqbF6reLaJ1dH-ltB2cLtE6V40Mo0vs-PiXx8ZAk5-Sf5gtw_0cF |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
DocumentTitleAlternate | 基于分区域PVDF压电薄膜的破片多参数测试装置及方法 |
ExternalDocumentID | CN109307533A |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_CN109307533A3 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 15:53:01 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | Chinese English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_CN109307533A3 |
Notes | Application Number: CN201811422618 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190205&DB=EPODOC&CC=CN&NR=109307533A |
ParticipantIDs | epo_espacenet_CN109307533A |
PublicationCentury | 2000 |
PublicationDate | 20190205 |
PublicationDateYYYYMMDD | 2019-02-05 |
PublicationDate_xml | – month: 02 year: 2019 text: 20190205 day: 05 |
PublicationDecade | 2010 |
PublicationYear | 2019 |
RelatedCompanies | BEIJING INSTITUTE OF TECHNOLOGY |
RelatedCompanies_xml | – name: BEIJING INSTITUTE OF TECHNOLOGY |
Score | 3.3100357 |
Snippet | The invention discloses a fragment multi-parameter testing device and method based on a regional PVDF (Polyvinylidene Fluoride) piezoelectric film. The testing... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
Title | Fragment multi-parameter testing device and method based on regional PVDF (Polyvinylidene Fluoride) piezoelectric film |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190205&DB=EPODOC&locale=&CC=CN&NR=109307533A |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1dT8IwFL1B_HxT1Ch-pCZm0YdFsBuwh8XIxkJMGItBwhth64ozYyMwMPDrvS2gvujb0iZN2u323N6dngNwy32jZGAPnk1qVNUYK6uGHxhqgB9MjXODV3xRGmi5leab9tLTezn42NyFkTqhn1IcESMqwHjP5H49_ili2ZJbOX3wI2xKn5yOaSvr0zGi22NJV-y62fDadttSLMu0XMV9NYVqEqIjpc9bsI1pdFXQvxrduriVMv4NKc4h7Hg4WpIdQW75XoB9a-O8VoC91vqHdwF2JUMzmGLjOgqnxzDHbHMoqnpE0gFVId89ErQWkgnNjGRIWCg2ADJIGFlZRBOBVoykCRFODCL7Jl7Xdsidl8aLeZQsYmEuGhInnqUTfLwn4yhcpiuTnCggPIpHJ3DjNDpWU8Wp9L_XrW-5P7Omp5BP0iQ8A1L2db3COQ1omWmcVQbV0gDTEsSrkNKQaedQ_Huc4n-dF3Ag3oEkNeuXkM8ms_AKMTvzr-VifwHR851r |
link.rule.ids | 230,309,783,888,25578,76884 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1dT8IwFL1B_MA3RY3iV03Mog-LYLfJHhYjGwsqjMUg4Y2wL5wZG4GBgV_vbQHxRd-WNmnSbrfn9u70HIDrwFGLKvbg2aRMRcnzSqLquKro4gdTDgI1UBxWGmhYSu1deunInQx8ru7CcJ3QLy6OiBHlYrynfL8erotYBudWju-cEJuSR7OlGcLydIzodl-UBaOiVe2m0dQFXdd0S7DeNKaahOhI6dMGbGKKXWY6-9V2hd1KGf6GFHMPtmwcLU73ITP_yENOXzmv5WGnsfzhnYdtztB0x9i4jMLxAUwx2-yzqh7hdECRyXcPGK2FpEwzI-4Tz2cbAOnFHllYRBOGVh5JYsKcGFj2Tey2YZIbO4lm0zCeRcxc1CdmNElG-HhLhqE_TxYmOaFLgjAaHMKVWW3pNRGn0v1Zt65urWdNjyAbJ7F_DKTkyLISBNSlJU8KPKX3UOxhWoJ45VPqe9IJFP4ep_Bf5yXkaq1GvVt_tl5PYZe9D05wls8gm44m_jnid-pc8IX_Bl0voFs |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Fragment+multi-parameter+testing+device+and+method+based+on+regional+PVDF+%28Polyvinylidene+Fluoride%29+piezoelectric+film&rft.inventor=SONG+PING&rft.inventor=WANG+XUANQUAN&rft.date=2019-02-05&rft.externalDBID=A&rft.externalDocID=CN109307533A |