Appearance inspection apparatus and appearance inspection method

• Main Author: UMEHARA JIRO
• Format: Patent
• Language: Chinese; English
• Published: 16.02.2018
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention provides an appearance inspection apparatus and an appearance inspection method. The appearance inspection apparatus radiates light from a light source to a flat inspection surface of anobject to be inspected as diffused light with an illumination device, and photographs the inspection surface with a camera. The camera and the light source are arranged in a positional relationship that satisfies the equation: Theta is not equal to alpha at any positions on the inspection surface, where Theta represents an angle formed between a straight line connecting an arbitrary position on the inspection surface to the camera and a line perpendicular to the inspection surface at that position, and alpha represents an incident angle of the diffused light. 本发明提供种外观检查装置及外观检查方法。外观检查装置将来自光源的光作为扩散光，通过照明装置向检查对象物的平坦的检查面照射，并通过摄像机拍摄检查面。设将检查面上的任意位置和摄像机连接的直线与该位置处的检查面的垂线所成的角度为角度θ时，摄像机和光源以无论在检查面上的哪个位置该位置处的角度θ与扩散光相对于该位置的入射角α都满足θ≠α的位置关系配置。