HANDLER FOR TESTING SEMICONDUCTOR DEVICES AND INFORMATION PROCESSING METHOD THEREOF

• Main Authors: LEE TAE MIN, SONG HEE KANG
• Format: Patent
• Language: Chinese; English
• Published: 11.08.2017
• Subjects: PERFORMING OPERATIONS; POSTAL SORTING; SEPARATING SOLIDS FROM SOLIDS; SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING; TRANSPORTING

The invention relates to a handler for testing semiconductor devices and an information processing method thereof. The handler for testing semiconductor devices comprises the components of a barcode identifier which identifiers barcodes endowed from a plurality of semiconductor devices by means of a position in a movement path of a plurality of semiconductor devices from the loading position of a loading part to an unloading position of the unloading part; and a control part which controls the barcode identifier and reads the barcode that is identified by the barcode identifier, thereby managing information of each semiconductor device. According to the handler, information management is performed on each semiconductor device instead of a batch of semiconductor devices, thereby improving reliability related with a testing result and managing capability which is related with each semiconductor device, and realizing personal record management. 本发明涉及半导体器件测试用分选机及其信息处理方法。本发明的半导体器件测试用分选机包括：条形码识别器，在从借助上述加载部分的加载的位置移动