Special device for measuring large curvature radius and measuring method

• Main Authors: WANG CHANG, ZHAO TONGBIN, XING MINGLU, XING MINGCAI
• Format: Patent
• Language: Chinese; English
• Published: 05.04.2017
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention discloses a special device for measuring a large curvature radius and a measuring method. The special device is characterized in that a handle is mounted on the bottom of an elastic U-shaped bracket, and a high elastic steel sheet is fixed between two ends of the U-shaped bracket; rollers are installed on the two ends of the U-shaped bracket; strain gauges are pasted on the centers of the front and back sides of the high elastic steel sheet; the handle is equipped with a wireless strain collector; the two strain gauges and the wireless strain collector form a half-bridge measuring circuit by means of wires; it is required that the high elastic steel sheet can be freely bent without plastic deformation after bearing force. According to the special device, the strain gauges are pasted on both sides of the elastic steel sheet which can be freely bent without plastic deformation, so that the strain gauges on both sides and the wireless strain collector form the half-bridge measuring circuit, thus el