Image transmission device and semiconductor test system applying same

The invention relates to an image transmission device and a semiconductor test system applying the same. The image transmission device comprises a mobile industry processor interface (MIPI) plate, at least one capture card and at least one transmission line. The mobile industry processor interface p...

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Bibliographic Details
Main Authors XIE CHENGZHE, CAI BINGYAN, ZHENG GUANGZHE, CAI JIAHONG
Format Patent
LanguageChinese
English
Published 02.03.2016
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Summary:The invention relates to an image transmission device and a semiconductor test system applying the same. The image transmission device comprises a mobile industry processor interface (MIPI) plate, at least one capture card and at least one transmission line. The mobile industry processor interface plate comprises a first image processing module, a first transmission module, and an input/output connector, wherein the input/output connector is used for being connected to a test supporting plate. The capture card comprises a second image processing module and a second transmission module. The transmission line is configured in a way that the two ends of the transmission line are connected to the first transmission module and the second transmission module respectively, so as to transmit image data to the capture card by means of the mobile industry processor interface plate. Through the image transmission device applied to the semiconductor test system, system configuration can be adjusted in a highly flexible m
Bibliography:Application Number: CN20141409107