Methods and apparatus to predict process quality in a process control system

• Main Authors: MARK NIXON, WOJSZNIS WILHELM K, RICHARD MUSTON PAUL, WOREK CHRISTOPHER J, BLEVINS TERRENCE L, RANDOLF REISS
• Format: Patent
• Language: English
• Published: 16.12.2015
• Subjects: CONTROL OR REGULATING SYSTEMS IN GENERAL; CONTROLLING; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS; PHYSICS; REGULATING

Method, apparatus and computer program used to predict process quality in a process control system, the method includes receiving process control information relating to a process at a first time including a first value associated with a first measured variable and a second value associated with a s...