Apparatus and method for inspecting light source

• Main Authors: WEN JIING FA, WANG YU CHIH, LIAO SHIH TING, HUANG CHIEN FU
• Format: Patent
• Language: English
• Published: 23.09.2015
• Subjects: COLORIMETRY; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; PHYSICS; RADIATION PYROMETRY; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

The invention provides an apparatus and method for inspecting a light resource. The apparatus includes a first light sensing module, a second light sensing module, a mobile module and a processing module. The first light sensing module receives light of the light source at a first position in a first time period for generating a first reference signal and generates a first measurement signal at the first position in a second time period. The light sensing module is arranged on the mobile module and receives light of the planar light source at a second position in a second period for generating a second measuring signal. The mobile module enables the second light sensing module to move relative to the second light sensing module. The processing module is coupled to and drives the mobile terminal and calculates a first terminate value corresponding to the second position based on the first reference signal, the first measurement signal and the second measurement signal. The apparatus may also include a measurement module used for receiving the above signals for generating a measurement value.