Load balancing in discrete devices
The invention relates to load balancing in discrete devices. In a general aspect, an apparatus can include a temperature measurement circuit configured to produce a first signal indicating a first operating temperature of a first semiconductor device and a temperature comparison circuit operationall...
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| Main Author | |
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| Format | Patent |
| Language | English |
| Published |
11.02.2015
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| Subjects | |
| Online Access | Get full text |
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| Abstract | The invention relates to load balancing in discrete devices. In a general aspect, an apparatus can include a temperature measurement circuit configured to produce a first signal indicating a first operating temperature of a first semiconductor device and a temperature comparison circuit operationally coupled with the temperature measurement circuit. The temperature comparison circuit can be configured to compare the first signal with a second signal indicating a second operating temperature of at least a second semiconductor device and produce a comparison signal indicating whether the indicated first operating temperature is higher, lower or equal to the indicated second operating temperature. The apparatus can also include an adjustment circuit configured to adjust operation of the first semiconductor device based on the comparison signal. |
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| AbstractList | The invention relates to load balancing in discrete devices. In a general aspect, an apparatus can include a temperature measurement circuit configured to produce a first signal indicating a first operating temperature of a first semiconductor device and a temperature comparison circuit operationally coupled with the temperature measurement circuit. The temperature comparison circuit can be configured to compare the first signal with a second signal indicating a second operating temperature of at least a second semiconductor device and produce a comparison signal indicating whether the indicated first operating temperature is higher, lower or equal to the indicated second operating temperature. The apparatus can also include an adjustment circuit configured to adjust operation of the first semiconductor device based on the comparison signal. |
| Author | ASHRAFZADEH, AHMAD R |
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| Notes | Application Number: CN201410373503 |
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| PublicationDate | 20150211 |
| PublicationDateYYYYMMDD | 2015-02-11 |
| PublicationDate_xml | – month: 02 year: 2015 text: 20150211 day: 11 |
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| PublicationYear | 2015 |
| RelatedCompanies | FAIRCHILD SEMICONDUCTOR (SUZHOU) CO., LTD FAIRCHILD SEMICONDUCTOR CORPORATION |
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| Snippet | The invention relates to load balancing in discrete devices. In a general aspect, an apparatus can include a temperature measurement circuit configured to... |
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| SubjectTerms | BASIC ELECTRIC ELEMENTS BASIC ELECTRONIC CIRCUITRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY PULSE TECHNIQUE SEMICONDUCTOR DEVICES |
| Title | Load balancing in discrete devices |
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