Semiconductor device
A semiconductor device comprises a first semiconductor layer formed by a first nitride semiconductor, a second semiconductor layer formed on the first semiconductor layer, a source electrode formed on the second semiconductor layer, a drain electrode formed on the second semiconductor layer, a first...
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Main Authors | , , , , , , |
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Format | Patent |
Language | Chinese English |
Published |
24.09.2014
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Subjects | |
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Abstract | A semiconductor device comprises a first semiconductor layer formed by a first nitride semiconductor, a second semiconductor layer formed on the first semiconductor layer, a source electrode formed on the second semiconductor layer, a drain electrode formed on the second semiconductor layer, a first grid electrode formed on the second semiconductor layer between the source electrode and the drain electrode, a second grid electrode formed on the second semiconductor layer between the source electrode and the first grid electrode via an insulation film, and a third grid electrode formed on the second semiconductor layer between the drain electrode and the first grid electrode via the insulation film, the second semiconductor layer is formed by a second nitride semiconductor whose band gap is larger than the first nitride semiconductor, the first grid electrode is connected with the second semiconductor layer in a Schottky manner, the second grid electrode is electrically connected with the first grid electrode, |
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AbstractList | A semiconductor device comprises a first semiconductor layer formed by a first nitride semiconductor, a second semiconductor layer formed on the first semiconductor layer, a source electrode formed on the second semiconductor layer, a drain electrode formed on the second semiconductor layer, a first grid electrode formed on the second semiconductor layer between the source electrode and the drain electrode, a second grid electrode formed on the second semiconductor layer between the source electrode and the first grid electrode via an insulation film, and a third grid electrode formed on the second semiconductor layer between the drain electrode and the first grid electrode via the insulation film, the second semiconductor layer is formed by a second nitride semiconductor whose band gap is larger than the first nitride semiconductor, the first grid electrode is connected with the second semiconductor layer in a Schottky manner, the second grid electrode is electrically connected with the first grid electrode, |
Author | YASUNOBU SAITO TAKAAKI YASUMOTO AKIRA YOSHIOKA HIDETOSHI FUJIMOTO NAOKO YANASE TAKESHI UCHIHARA TASUKU ONO |
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Notes | Application Number: CN201310731532 |
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Snippet | A semiconductor device comprises a first semiconductor layer formed by a first nitride semiconductor, a second semiconductor layer formed on the first... |
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SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
Title | Semiconductor device |
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