Serial peripheral device interface bus test system and method

• Main Author: HE RUIXIONG
• Format: Patent
• Language: Chinese; English
• Published: 19.09.2012
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The invention discloses an SPI (serial peripheral device interface) bus test system and an SPI (serial peripheral device interface) bus test method. The system comprises an obtaining module, an intercepting module, an overlaying module, a drawing module, a judging module and the output module, wherein the obtaining module is used for obtaining waveforms of a data signal, a clock signal and a selection signal of the SPI bus; the intercepting module is used for intercepting effective waveforms of the data signal and the clock signal from the waveforms of the data signal and the clock signal according to the waveform of the selection signal; the overlaying module is used for forwardly and backwardly lapsing the scheduled time by using each rising edge of the clock signal as the reference, intercepting the effective waveform of each section of data signal and clock signal from the effective waveforms of the data signal and the clock signal, and overlaying the effective waveforms to obtain eye patterns of the data