IEC (International Electrotechnical Commission) 61850 model extension method

The invention provides an IEC (International Electrotechnical Commission) 61850 model extension method, which comprises the following steps of: extending logical nodes, and respectively regulating and defining and then adding lightning location supervision SLLC (Series Lighting Location Compensator)...

Full description

Saved in:
Bibliographic Details
Main Authors YIN DEHUA, GU BOCHUAN, ZHOU YILIN, XIA YAJUN, SUN JIANWEI, HU YAPING, SUN XUJIANG, WANG LU, LIU FEI, JIANG WEIQI, HUANG JINHUA, LI DONG, YANG FENG
Format Patent
LanguageChinese
English
Published 12.09.2012
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
Online AccessGet full text

Cover

Abstract The invention provides an IEC (International Electrotechnical Commission) 61850 model extension method, which comprises the following steps of: extending logical nodes, and respectively regulating and defining and then adding lightning location supervision SLLC (Series Lighting Location Compensator), ice accretion supervision SIAC (Series Ice Accretion Compensator) and power quality supervision SPQC (Series Power Quality Compensator) to sensor monitoring logic nodes. According to the IEC61850 model extension method, an IEC61850 model is extended, the common online supervision such as the lightning location supervision SLLC, the ice accretion supervision SIAC and the power quality supervision SPQC are added to the sensor monitoring logic nodes, so that the logic nodes required by device state monitoring are increased, and thus the application range of the IEC61850 in system modeling is broadened, and the flexibility of the IEC61850 in system modeling is improved simultaneously.
AbstractList The invention provides an IEC (International Electrotechnical Commission) 61850 model extension method, which comprises the following steps of: extending logical nodes, and respectively regulating and defining and then adding lightning location supervision SLLC (Series Lighting Location Compensator), ice accretion supervision SIAC (Series Ice Accretion Compensator) and power quality supervision SPQC (Series Power Quality Compensator) to sensor monitoring logic nodes. According to the IEC61850 model extension method, an IEC61850 model is extended, the common online supervision such as the lightning location supervision SLLC, the ice accretion supervision SIAC and the power quality supervision SPQC are added to the sensor monitoring logic nodes, so that the logic nodes required by device state monitoring are increased, and thus the application range of the IEC61850 in system modeling is broadened, and the flexibility of the IEC61850 in system modeling is improved simultaneously.
Author SUN JIANWEI
JIANG WEIQI
GU BOCHUAN
SUN XUJIANG
HUANG JINHUA
LI DONG
LIU FEI
HU YAPING
YIN DEHUA
WANG LU
ZHOU YILIN
XIA YAJUN
YANG FENG
Author_xml – fullname: YIN DEHUA
– fullname: GU BOCHUAN
– fullname: ZHOU YILIN
– fullname: XIA YAJUN
– fullname: SUN JIANWEI
– fullname: HU YAPING
– fullname: SUN XUJIANG
– fullname: WANG LU
– fullname: LIU FEI
– fullname: JIANG WEIQI
– fullname: HUANG JINHUA
– fullname: LI DONG
– fullname: YANG FENG
BookMark eNqNir0KwjAURjPo4N87xE0HoT8YXSVULIiTewnpJy0k95bmDj6-FXwApwPnnKWaERMW6l5XVu9qEozkpGdyQVcBXkYW-I56PwnLMfYpTXWvTX4-Zjpyi6DxFtBX6wjpuF2r-cuFhM2PK7W9Vk97O2DgBmlwHgRp7CPPCmPKIj9dyn-eDyFENlA
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID CN102663217A
GroupedDBID EVB
ID FETCH-epo_espacenet_CN102663217A3
IEDL.DBID EVB
IngestDate Fri Jul 19 16:33:21 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language Chinese
English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_CN102663217A3
Notes Application Number: CN20121157317
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120912&DB=EPODOC&CC=CN&NR=102663217A
ParticipantIDs epo_espacenet_CN102663217A
PublicationCentury 2000
PublicationDate 20120912
PublicationDateYYYYMMDD 2012-09-12
PublicationDate_xml – month: 09
  year: 2012
  text: 20120912
  day: 12
PublicationDecade 2010
PublicationYear 2012
RelatedCompanies SHANGHAI INTEGRATED ELECTRONIC SYSTEMS LAB CO., LTD
ELECTRIC POWER RESEARCH INSTITUTE OF GUANGDONG POWER GRID CORPORATION
RelatedCompanies_xml – name: ELECTRIC POWER RESEARCH INSTITUTE OF GUANGDONG POWER GRID CORPORATION
– name: SHANGHAI INTEGRATED ELECTRONIC SYSTEMS LAB CO., LTD
Score 2.9708636
Snippet The invention provides an IEC (International Electrotechnical Commission) 61850 model extension method, which comprises the following steps of: extending...
SourceID epo
SourceType Open Access Repository
SubjectTerms CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
Title IEC (International Electrotechnical Commission) 61850 model extension method
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120912&DB=EPODOC&locale=&CC=CN&NR=102663217A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1NS8NAEB1q_bxpVLR-sIIEPQTTZBPbQxC7Sahi0yJVeivJJov1kBYTEfz1zm5Tqwe9zsKSDMy-2dl58wDOTTuxHC6EPP2oQVupMNpWSxg8zbhJ03ZsupIo3Ivc7hO9HzmjGrwuuDBqTuiHGo6IEcUx3kt1Xs-WRSxf9VYWV8kETdObcOj5enU7lkTQpqX7HS8Y9P0-0xnzWKRHj5jrIhLZmH_frsAqptHXMhqC545kpcx-Qkq4DWsD3C0vd6D2-aLBJlsor2mw0asevDVYVx2avEBjFYXFLjzcBYxc_KrlkWAuZzMfyYp-J5L5MZEtrvklcREuTaJEb4iqekszmYtH78FZGAxZ18APHH97Y8yi5b_Y-1DPp3l2AMQRTpy6ZhJbNqd4442pkJPvKSK01Ceih9D4e5_Gf4tHsCU9ayjdhGOol2_v2QkicZmcKhd-ARjIjEo
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5qfdSbRkXrawUJegjGZBPbQxG7SUk1SYtE6S3kifWQFhsR_PXOblqrB73OwpIMzH6zs_PNB3Cu6rFmJHnOTz-q0FaaK22tlStJmiUqTduRanKisOebzhO9HxmjGrwuuDBiTuiHGI6IEZVgvJfivJ4ui1iW6K2cXcVjNE1ue0HHkue3Y04EvdZkq9uxhwNrwGTGOsyX_UfMdRGJdMy_71ZgFVPsGx4N9nOXs1KmPyGltwVrQ9ytKLeh9vkiQYMtlNck2PDmD94SrIsOzWSGxnkUznbA7duMXPyq5RG7krOpRrKi3wlnfox5i2txSUyES5UI0Rsiqt7cTCrx6F0469kBcxT8wPDbGyHzl_-i70G9mBTZPhAjN6LUVONI0xOKN96I5nzyPUWE5vpE9ACaf-_T_G_xFBpO4Lmh2_cfDmGTe1kRGgpHUC_f3rNjROUyPhHu_ALZd489
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=IEC+%28International+Electrotechnical+Commission%29+61850+model+extension+method&rft.inventor=YIN+DEHUA&rft.inventor=GU+BOCHUAN&rft.inventor=ZHOU+YILIN&rft.inventor=XIA+YAJUN&rft.inventor=SUN+JIANWEI&rft.inventor=HU+YAPING&rft.inventor=SUN+XUJIANG&rft.inventor=WANG+LU&rft.inventor=LIU+FEI&rft.inventor=JIANG+WEIQI&rft.inventor=HUANG+JINHUA&rft.inventor=LI+DONG&rft.inventor=YANG+FENG&rft.date=2012-09-12&rft.externalDBID=A&rft.externalDocID=CN102663217A