Image processing method, image processing device, and surface inspection device using the image processing device

• Main Authors: MORI HIDEKI, MIYAZONO KOICHI, HAYASHI YOSHINORI, WAKABA HIROSHI, KAWASAKI SHOZO, HAMATANI KAZUHIKO
• Format: Patent
• Language: Chinese; English
• Published: 02.01.2013
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING