Integrated circuit self-test architecture

• Main Author: PELGROM MARCEL,VEENDRICK HENDRICUS J. M
• Format: Patent
• Language: English
• Published: 31.10.2007
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

An integrated circuit (1) comprises a monitor (Ml, M3, M3) operable to produce monitor data in dependence upon a measured parameter of the integrated circuit (1); and a self test controller (28) connected to receive monitor data from the monitor (Ml, M2, M3). The self-test controller is also operabl...