Diagnostic circuit for an integrated circuit
An integrated circuit having a plurality of functional circuits interconnected via a functional bus is provided with a diagnostic bus-master circuit which uses bus transactions on the functional bus to perform diagnostic operations. These diagnostic operations can be performed in real time during no...
Saved in:
| Main Authors | , |
|---|---|
| Format | Patent |
| Language | Chinese English |
| Published |
09.04.2008
|
| Subjects | |
| Online Access | Get full text |
Cover
Loading…
| Abstract | An integrated circuit having a plurality of functional circuits interconnected via a functional bus is provided with a diagnostic bus-master circuit which uses bus transactions on the functional bus to perform diagnostic operations. These diagnostic operations can be performed in real time during normal speed operation of the integrated circuit to produce more accurate diagnostic results. The diagnostic bus-master circuit is particularly useful for reading data values from memory or writing data values to memory as part of diagnostic operations. |
|---|---|
| AbstractList | An integrated circuit having a plurality of functional circuits interconnected via a functional bus is provided with a diagnostic bus-master circuit which uses bus transactions on the functional bus to perform diagnostic operations. These diagnostic operations can be performed in real time during normal speed operation of the integrated circuit to produce more accurate diagnostic results. The diagnostic bus-master circuit is particularly useful for reading data values from memory or writing data values to memory as part of diagnostic operations. |
| Author | KIMELMAN PAUL FIELD IAN |
| Author_xml | – fullname: FIELD IAN – fullname: KIMELMAN PAUL |
| BookMark | eNrjYmDJy89L5WTQcclMTM_LLy7JTFZIzixKLs0sUUjLL1JIzFPIzCtJTS9KLElNgcnwMLCmJeYUp_JCaW4GJTfXEGcP3dSC_PjU4oLE5NS81JJ4Zz9DAwNjCwNjY1NnZ2OiFAEA4SYsEw |
| ContentType | Patent |
| DBID | EVB |
| DatabaseName | esp@cenet |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Medicine Chemistry Sciences Physics |
| ExternalDocumentID | CN100380335CC |
| GroupedDBID | EVB |
| ID | FETCH-epo_espacenet_CN100380335CC3 |
| IEDL.DBID | EVB |
| IngestDate | Fri Jul 19 14:33:06 EDT 2024 |
| IsOpenAccess | true |
| IsPeerReviewed | false |
| IsScholarly | false |
| Language | Chinese English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-epo_espacenet_CN100380335CC3 |
| Notes | Application Number: CN20038026315 |
| OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080409&DB=EPODOC&CC=CN&NR=100380335C |
| ParticipantIDs | epo_espacenet_CN100380335CC |
| PublicationCentury | 2000 |
| PublicationDate | 20080409 |
| PublicationDateYYYYMMDD | 2008-04-09 |
| PublicationDate_xml | – month: 04 year: 2008 text: 20080409 day: 09 |
| PublicationDecade | 2000 |
| PublicationYear | 2008 |
| RelatedCompanies | ADVANCED RISC MACH LTD |
| RelatedCompanies_xml | – name: ADVANCED RISC MACH LTD |
| Score | 2.8045259 |
| Snippet | An integrated circuit having a plurality of functional circuits interconnected via a functional bus is provided with a diagnostic bus-master circuit which uses... |
| SourceID | epo |
| SourceType | Open Access Repository |
| SubjectTerms | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| Title | Diagnostic circuit for an integrated circuit |
| URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080409&DB=EPODOC&locale=&CC=CN&NR=100380335C |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_m_HzTqahTKSJ9spi26ddDEZa2DGHdkCl7G22asvrQjbVD8K_32q2bT3u9g3C55HJ3yd0vAM-WKVRBE00RUawp1LEjxeEJwVSFqlRQ7hC7ahQehGb_k75PjEkLvptemBon9KcGR0SL4mjvZX1eL3aXWF5dW1m8xhmS5m_B2PXkJju2cU86stdz_dHQGzKZMZeFcviBsS7RbaLrBjuAwyqMrnD2_a9e1ZWy-O9SgnM4GuFoeXkBrd9ZB05Z8_NaB04GmwfvDhzXFZq8QOLGCotLePHW9XG45hLPlnyVlRLGnlKUS1v0h6ThXMFT4I9ZX0EBptvZTlm4k5Xp19DO57m4AclS1YhqiUktbqNy0yjheprGhAqLG4at30J3z0B3e7ldOFvXQVCFOPfQLpcr8YDOtowfay39AfJego0 |
| link.rule.ids | 230,309,786,891,25594,76904 |
| linkProvider | European Patent Office |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT8JAEJ4gPvCmVaLiozGmJxv72NL2QEzY0lSlhZhquDXtdol4KISWmPjrHQoFT1xnks3s7M7OzO7MtwAPZpurnKSazONEk4ltxbLNUgVTFaISTpitWMtGYT9oex_kdWSMavBd9cKUOKE_JTgiWhRDey_K83q2vcRyytrK_CmZIGn67IYdR6qyYwv3pC053U5vOHAGVKK0QwMpeMdYV9EtRdcNugf7JqaES5z93md32ZUy--9S3BM4GOJoWXEKtd8vARq0-nlNgCN__eAtwGFZoclyJK6tMD-DR2dVH4drLrLJnC0mhYixpxhn4gb9Ia0453Dv9kLqyShAtJltRIOtrFRvQj2bZvwCRFNVY6KlbWIyC5U7jlOmj8eJQrjJDMPSL6G1Y6Crndw7aHih34_6L8FbC45XNRFEVuxrqBfzBb9Bx1skt6XG_gAzJIV4 |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Diagnostic+circuit+for+an+integrated+circuit&rft.inventor=FIELD+IAN&rft.inventor=KIMELMAN+PAUL&rft.date=2008-04-09&rft.externalDBID=C&rft.externalDocID=CN100380335CC |