Refractive index determination by micro interferometric reflection detection

• Main Authors: PETER ESKILD ANDERSEN, HENRIK SCHIOTT SORENSEN, DARRYL J. BORNHOP
• Format: Patent
• Language: English
• Published: 29.03.2004
• Edition: 7
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

A method and an apparatus for absolute refractive index measurements are disclosed, wherein a beam of spatially coherent laser light is directed perpendicularly on to a side of a capillary tube (12) and back reflected light is detected (16) over a range of angles (22) with respect to the incident li...