Measurement of temporal evolution of antiferromagnetic domain change in nickel oxide driven by 2TO phonon mode excitation via pump-probe experiment

Abstract The temporal evolution of antiferromagnetic domain pattern changes under resonant excitation of the second-order transverse optical (2TO) phonon mode in nickel oxide was investigated using mid-infrared free electron laser (MIR-FEL) pulses and visible nanosecond probe laser pulses at room te...

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Published inJapanese Journal of Applied Physics
Main Authors BO, JU YOON HNIN, Zen, Heishun, Ohgaki, Hideaki
Format Journal Article
LanguageEnglish
Published 16.10.2024
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Abstract Abstract The temporal evolution of antiferromagnetic domain pattern changes under resonant excitation of the second-order transverse optical (2TO) phonon mode in nickel oxide was investigated using mid-infrared free electron laser (MIR-FEL) pulses and visible nanosecond probe laser pulses at room temperature. We visualized the domain patterns through magneto-optical polarized microscopy in transmission and observed their temporal variation after the phonon excitation via MIR-FEL. We evaluated the differences throughout the timeline using the structural similarity index measure (SSIM) technique from domain images with and without MIR-FEL irradiation. We found that the MIR-FEL irradiation induces significant structural changes in the domain patterns. The maximum difference was observed at the timing of the MIR-FEL irradiation and exponentially recovered with the time constant of 1.4 ± 0.2 ms. This rather long-time constant could be owing to the spin relaxation, whilst further investigation is needed to confirm the underlying mechanism.
AbstractList Abstract The temporal evolution of antiferromagnetic domain pattern changes under resonant excitation of the second-order transverse optical (2TO) phonon mode in nickel oxide was investigated using mid-infrared free electron laser (MIR-FEL) pulses and visible nanosecond probe laser pulses at room temperature. We visualized the domain patterns through magneto-optical polarized microscopy in transmission and observed their temporal variation after the phonon excitation via MIR-FEL. We evaluated the differences throughout the timeline using the structural similarity index measure (SSIM) technique from domain images with and without MIR-FEL irradiation. We found that the MIR-FEL irradiation induces significant structural changes in the domain patterns. The maximum difference was observed at the timing of the MIR-FEL irradiation and exponentially recovered with the time constant of 1.4 ± 0.2 ms. This rather long-time constant could be owing to the spin relaxation, whilst further investigation is needed to confirm the underlying mechanism.
Author BO, JU YOON HNIN
Ohgaki, Hideaki
Zen, Heishun
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  givenname: Hideaki
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  surname: Ohgaki
  fullname: Ohgaki, Hideaki
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Snippet Abstract The temporal evolution of antiferromagnetic domain pattern changes under resonant excitation of the second-order transverse optical (2TO) phonon mode...
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