Direct Optical Probing of the Magnetic Properties of the Layered Antiferromagnet CrPS$_4
Unusual magnetic properties of Van der Waals type antiferromagnetic semiconductors make them highly attractive for spintronics and optoelectronics. A link between the magnetic and optical properties of those materials, required for practical applications, has not been, however, established so far. H...
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Main Authors | , , , , , , , , , , , , , |
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Format | Journal Article |
Language | English |
Published |
25.07.2024
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Subjects | |
Online Access | Get full text |
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Summary: | Unusual magnetic properties of Van der Waals type antiferromagnetic
semiconductors make them highly attractive for spintronics and optoelectronics.
A link between the magnetic and optical properties of those materials, required
for practical applications, has not been, however, established so far. Here, we
report on a combined experimental and theoretical study of magnetic, optical,
and structural properties of bulk CrPS$_{4}$ samples. We find that the
magnetic-field-dependent circular polarization degree of the photoluminescence
is a direct measure of the net magnetization of CrPS$_{4}$. Complementary,
Raman scattering measured as a function of magnetic field and temperature
enables the determination of the magnetic susceptibility curve of the material.
Our experimental results are backed by Our experimental results are supported
by density functional theory calculations that take as input the lattice
parameters determined from temperature-dependent X-ray diffraction
measurements. This allows us to explain the impact of spin ordering on the
spectral position of Raman transitions in CrPS$_4$, as well as anomalous
temperature shifts of selected of them. The presented method for all-optical
determination of the magnetic properties is highly promising for studies of
spin ordering and magnetic phase transitions in single- or a few-layer samples
of magnetic layered materials, for which a poor signal-to-noise ratio precludes
any reliable neutron scattering or magnetometry measurements. |
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DOI: | 10.48550/arxiv.2407.17912 |