Magnetization nutation in magnetic semiconductors: Effective spin model with anisotropic RKKY exchange interaction
Phys. Rev. B 111, 014410 (2025) We demonstrate that the magnetization in magnetic semiconductors exhibits nutational motion when subjected to an external magnetic field. This behavior originates from the splitting of the conduction-electron band which induces anisotropic, distance-dependent exchange...
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Main Author | |
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Format | Journal Article |
Language | English |
Published |
03.07.2024
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Subjects | |
Online Access | Get full text |
DOI | 10.48550/arxiv.2407.03098 |
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Summary: | Phys. Rev. B 111, 014410 (2025) We demonstrate that the magnetization in magnetic semiconductors exhibits
nutational motion when subjected to an external magnetic field. This behavior
originates from the splitting of the conduction-electron band which induces
anisotropic, distance-dependent exchange coupling between localized spins.
To investigate this phenomenon, we examine a general system that includes
both charge and spin degrees of freedom, characteristic of a magnetic
semiconductor. This system is composed of two subsystems: (1) a gas of
noninteracting conduction electrons and (2) a ferromagnetic array of localized
spins, coupled through the Vonsovskii (\textit{sd}) local interaction. The
entire system is subject to external electrical and magnetic disturbances.
Through the Feynman-Schwinger formalism, we integrate out the faster
(Grassmann) charge degrees of freedom associated with the conduction electrons
to obtain the effective Hamiltonian for the localized spins in the form of an
XXZ spin model. We then provide general analytical formulas for the
corresponding anisotropic exchange couplings, expressed in Fourier and direct
spaces, as functions of the effective field that induces conduction-band
splitting.
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We hope this study will motivate further research into nutational phenomena
in magnetic semiconductors, possibly resulting in improvements in the accurate
control of magnetization dynamics within spin-based electronic devices. |
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DOI: | 10.48550/arxiv.2407.03098 |