Compatibility of projective measurements subject to white noise and loss
Phys. Rev. A 109, 022215 (2024) It is well known that when two or more quantum measurements suffer from imperfections they may lose their incompatibility. For a quantum system of finite dimension d we study the incompatibility of all projective measurements subjected to white noise and loss. We deri...
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| Main Author | |
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| Format | Journal Article |
| Language | English |
| Published |
17.04.2023
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| Subjects | |
| Online Access | Get full text |
| DOI | 10.48550/arxiv.2304.08548 |
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| Abstract | Phys. Rev. A 109, 022215 (2024) It is well known that when two or more quantum measurements suffer from
imperfections they may lose their incompatibility. For a quantum system of
finite dimension d we study the incompatibility of all projective measurements
subjected to white noise and loss. We derive a necessary and sufficient
conditions for this set of measurements to becomes compatible in terms of their
visibility $p$ and efficiency $\eta$. |
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| AbstractList | Phys. Rev. A 109, 022215 (2024) It is well known that when two or more quantum measurements suffer from
imperfections they may lose their incompatibility. For a quantum system of
finite dimension d we study the incompatibility of all projective measurements
subjected to white noise and loss. We derive a necessary and sufficient
conditions for this set of measurements to becomes compatible in terms of their
visibility $p$ and efficiency $\eta$. |
| Author | Sekatski, Pavel |
| Author_xml | – sequence: 1 givenname: Pavel surname: Sekatski fullname: Sekatski, Pavel |
| BackLink | https://doi.org/10.48550/arXiv.2304.08548$$DView paper in arXiv https://doi.org/10.1103/PhysRevA.109.022215$$DView published paper (Access to full text may be restricted) |
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| Snippet | Phys. Rev. A 109, 022215 (2024) It is well known that when two or more quantum measurements suffer from
imperfections they may lose their incompatibility. For... |
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| SubjectTerms | Physics - Quantum Physics |
| Title | Compatibility of projective measurements subject to white noise and loss |
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