Jurečka, S., Imamura, K., Matsumoto, T., & Kobayashi, H. (2017). Reflectance analysis of porosity gradient in nanostructured silicon layers. SPIE. https://doi.org/10.1117/12.2292723
Chicago Style (17th ed.) CitationJurečka, Stanislav, Kentaro Imamura, Taketoshi Matsumoto, and Hikaru Kobayashi. Reflectance Analysis of Porosity Gradient in Nanostructured Silicon Layers. SPIE, 2017. https://doi.org/10.1117/12.2292723.
MLA (9th ed.) CitationJurečka, Stanislav, et al. Reflectance Analysis of Porosity Gradient in Nanostructured Silicon Layers. SPIE, 2017. https://doi.org/10.1117/12.2292723.
Warning: These citations may not always be 100% accurate.