王华华, 余永坤, & 于敏. (2021). MU-MIMO单比特ADC系统中软输出检测算法. 系统工程与电子技术, 43(2), 555-560. https://doi.org/10.12305/j.issn.1001-506X.2021.02.30
Chicago Style (17th ed.) Citation王华华, 余永坤, and 于敏. "MU-MIMO单比特ADC系统中软输出检测算法." 系统工程与电子技术 43, no. 2 (2021): 555-560. https://doi.org/10.12305/j.issn.1001-506X.2021.02.30.
MLA (9th ed.) Citation王华华, et al. "MU-MIMO单比特ADC系统中软输出检测算法." 系统工程与电子技术, vol. 43, no. 2, 2021, pp. 555-560, https://doi.org/10.12305/j.issn.1001-506X.2021.02.30.
Warning: These citations may not always be 100% accurate.