胡昭华, 郑伟, & 钱坤. (2019). 残差深度特征和漂移检测的核相关滤波跟踪. 控制理论与应用, 36(4), 613-621. https://doi.org/10.7641/CTA.2018.80299
Chicago Style (17th ed.) Citation胡昭华, 郑伟, and 钱坤. "残差深度特征和漂移检测的核相关滤波跟踪." 控制理论与应用 36, no. 4 (2019): 613-621. https://doi.org/10.7641/CTA.2018.80299.
MLA (9th ed.) Citation胡昭华, et al. "残差深度特征和漂移检测的核相关滤波跟踪." 控制理论与应用, vol. 36, no. 4, 2019, pp. 613-621, https://doi.org/10.7641/CTA.2018.80299.
Warning: These citations may not always be 100% accurate.