基于神经网络的IGBT模块剩余使用寿命预测模型
TM93; 对IGBT模块使用寿命进行预测是评估其健康状态和可靠性的有效手段.基于IGBT老化实验测量,构建了包括饱和压降和结温的二维IGBT状态检测指标.对于归一化后的数据,提出了分段处理方法,去除了 IGBT键合线断裂引起的较大指标波动.以饱和压降和结温数据为基础,提出了基于BP神经网络算法的IGBT剩余寿命预测模型.针对同样本不同通道、不同实验条件样本等情况,验证了本模型在剩余寿命预测中的准确性....
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| Published in | 电测与仪表 Vol. 60; no. 1; pp. 132 - 138 |
|---|---|
| Main Authors | , |
| Format | Journal Article |
| Language | Chinese |
| Published |
华中科技大学电气与电子工程学院,武汉430074
15.01.2023
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| Subjects | |
| Online Access | Get full text |
| ISSN | 1001-1390 |
| DOI | 10.19753/j.issn1001-1390.2023.01.019 |
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| Abstract | TM93; 对IGBT模块使用寿命进行预测是评估其健康状态和可靠性的有效手段.基于IGBT老化实验测量,构建了包括饱和压降和结温的二维IGBT状态检测指标.对于归一化后的数据,提出了分段处理方法,去除了 IGBT键合线断裂引起的较大指标波动.以饱和压降和结温数据为基础,提出了基于BP神经网络算法的IGBT剩余寿命预测模型.针对同样本不同通道、不同实验条件样本等情况,验证了本模型在剩余寿命预测中的准确性. |
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| AbstractList | TM93; 对IGBT模块使用寿命进行预测是评估其健康状态和可靠性的有效手段.基于IGBT老化实验测量,构建了包括饱和压降和结温的二维IGBT状态检测指标.对于归一化后的数据,提出了分段处理方法,去除了 IGBT键合线断裂引起的较大指标波动.以饱和压降和结温数据为基础,提出了基于BP神经网络算法的IGBT剩余寿命预测模型.针对同样本不同通道、不同实验条件样本等情况,验证了本模型在剩余寿命预测中的准确性. |
| Author | 郭子庆 王学华 |
| AuthorAffiliation | 华中科技大学电气与电子工程学院,武汉430074 |
| AuthorAffiliation_xml | – name: 华中科技大学电气与电子工程学院,武汉430074 |
| Author_FL | Guo Ziqing Wang Xuehua |
| Author_FL_xml | – sequence: 1 fullname: Guo Ziqing – sequence: 2 fullname: Wang Xuehua |
| Author_xml | – sequence: 1 fullname: 郭子庆 – sequence: 2 fullname: 王学华 |
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| Copyright | Copyright © Wanfang Data Co. Ltd. All Rights Reserved. |
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| DocumentTitle_FL | Prediction model of neural network-based IGBT module remaining service life |
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| Keywords | 分段拟合 神经网络 IGBT模块寿命预测 老化机理 |
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| Snippet | TM93; 对IGBT模块使用寿命进行预测是评估其健康状态和可靠性的有效手段.基于IGBT老化实验测量,构建了包括饱和压降和结温的二维IGBT状态检测指标.对于归一化后的数据,提出了分段处理方法,去除了... |
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| Title | 基于神经网络的IGBT模块剩余使用寿命预测模型 |
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