Effects of Substrate Temperature, Deposition Pressure and Thickness on the Morphology of Ultrathin Platinum Film on SiO sub 2 /Si Substrate
The dependence on thickness of the resistance of platinum film deposited by electron-beam evaporation at room temperature onto a thermally grown SiO sub 2 substrate, shows that the Pt film is in a discontinuous island form when the thickness is < 1.3 nm. At approx 2 nm the film is very continuous...
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Published in | Thin solid films Vol. 219; no. 1-2; pp. 257 - 265 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
30.10.1992
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Online Access | Get full text |
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