APA (7th ed.) Citation

Wu, Y., Xin, Z., Zhang, Z., Wang, B., Peng, R., Wang, E., . . . Liu, K. (2023). All‐Transfer Electrode Interface Engineering Toward Harsh‐Environment‐Resistant MoS2 Field‐Effect Transistors. Advanced materials (Weinheim), 35(18), e2210735-n/a. https://doi.org/10.1002/adma.202210735

Chicago Style (17th ed.) Citation

Wu, Yonghuang, et al. "All‐Transfer Electrode Interface Engineering Toward Harsh‐Environment‐Resistant MoS2 Field‐Effect Transistors." Advanced Materials (Weinheim) 35, no. 18 (2023): e2210735-n/a. https://doi.org/10.1002/adma.202210735.

MLA (9th ed.) Citation

Wu, Yonghuang, et al. "All‐Transfer Electrode Interface Engineering Toward Harsh‐Environment‐Resistant MoS2 Field‐Effect Transistors." Advanced Materials (Weinheim), vol. 35, no. 18, 2023, pp. e2210735-n/a, https://doi.org/10.1002/adma.202210735.