Jurečka, S., Králik, M., & Pinčík, E. (2019). Microstructure and optical properties of layers formed by anodic etching of silicon. AIP conference proceedings, 2131(1), . https://doi.org/10.1063/1.5119476
Chicago Style (17th ed.) CitationJurečka, Stanislav, Martin Králik, and Emil Pinčík. "Microstructure and Optical Properties of Layers Formed by Anodic Etching of Silicon." AIP Conference Proceedings 2131, no. 1 (2019). https://doi.org/10.1063/1.5119476.
MLA (9th ed.) CitationJurečka, Stanislav, et al. "Microstructure and Optical Properties of Layers Formed by Anodic Etching of Silicon." AIP Conference Proceedings, vol. 2131, no. 1, 2019, https://doi.org/10.1063/1.5119476.
Warning: These citations may not always be 100% accurate.