APA (7th ed.) Citation

Nelson, F., Diebold, A. C., & Hull, R. (2009). Simulation Study Of Transmission Electron Microscopy Imaging Of Graphene Stacking. 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 1173, 271-274. https://doi.org/10.1063/1.3251232

Chicago Style (17th ed.) Citation

Nelson, F., A C. Diebold, and R. Hull. "Simulation Study Of Transmission Electron Microscopy Imaging Of Graphene Stacking." 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics 1173 (2009): 271-274. https://doi.org/10.1063/1.3251232.

MLA (9th ed.) Citation

Nelson, F., et al. "Simulation Study Of Transmission Electron Microscopy Imaging Of Graphene Stacking." 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, vol. 1173, 2009, pp. 271-274, https://doi.org/10.1063/1.3251232.