Ultrasensitive broadband photodetectors based on two-dimensional Bi2O2Te films

• Published in: Journal of materials chemistry. C, Materials for optical and electronic devices Vol. 9; no. 39; pp. 13713 - 13721
• Main Authors: Tian, Pin, Wu, Hongbo, Tang, Libin, Xiang, Jinzhong, Ji, Rongbin, Lau, Shu Ping, Teng, Kar Seng, Guo, Wei, Yao, Yugui, Lain-Jong, Li
• Format: Journal Article
• Language: English
• Published: Cambridge Royal Society of Chemistry 21.10.2021
• Subjects: Annealing; Bismuth tellurides; Broadband; CMOS; Infrared radiation; Light; Optical properties; Optoelectronics; Photoelectric effect; Photometers; Short wave radiation; Silicon substrates; Thin films; Two dimensional materials

Two-dimensional (2D) materials exhibit many unique optical and electronic properties that are highly desirable for application in optoelectronics. Here, we report the study of a photodetector based on 2D Bi2O2Te grown on an n-Si substrate. The 2D Bi2O2Te material was transformed from a sputtered Bi2...