The determination of the thickness and optical constants of the ZnO crystalline thin film by using envelope method

• Published in: Journal of Optoelectronics and Advanced Materials Vol. 8; no. 4; pp. 1410 - 1413
• Main Authors: Caglar, M, Caglar, Y, Ilican, S
• Format: Journal Article
• Language: English
• Published: 01.08.2006

ZnO crystalline thin film has been deposited onto glass substrates by the spray pyrolysis method. The crystallographic structure of the film and the size of the crystallites in the film were studied by X-ray diffraction. XRD measurement shows that the film is crystallized in the wurtzite phase and p...