Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion: Determination of micro‐morphologies by atomic force microscopy (AFM) - Ţălu, Ştefan; Yadav, Ram Pratap; Ali, Arman; Alireza Grayeli Korpi; Sobola, Dinara; Ţălu, Mihai; Rezaee, Sahare; Achour, Amine; Jurečka, Stanislav; Mardani, Mohsen (Vakuum in Forschung und Praxis : Zeitschrift für Vakuumtechnologie, Oberflèachen und Dünne Schichten, 2019)
Keywords: Atomic force microscopy; Austenitic stainless steels; Autocorrelation functions; Correlation analysis; Electron beams; Fluence; Fractal analysis; Fractals; Morphology; Nickel; Nitrogen ions; Substrates; Thickness; Thin films; Variations