Reliability analysis of failure threshold value with uncertain Liu process

• Published in: Journal of intelligent & fuzzy systems Vol. 44; no. 6; p. 9757
• Main Authors: Chun, Wei, Shi, Haiyan, Liu, Baoliang, Zhang, Zhiqiang, Wen, Yanqing
• Format: Journal Article
• Language: English
• Published: London Sage Publications Ltd 01.01.2023
• Subjects: Failure analysis; Mean time to failure; Reliability analysis; Substations

A system undergoes a failure process in which the internal degradation and external loads are independent and compete with each other. In the reliability model of competitive failure, the threshold of failure is often a dynamic process that changes with time. Based on this, this paper constructs a m...