APA (7th ed.) Citation

Chun, W., Shi, H., Liu, B., Zhang, Z., & Wen, Y. (2023). Reliability analysis of failure threshold value with uncertain Liu process. Journal of intelligent & fuzzy systems, 44(6), 9757. https://doi.org/10.3233/JIFS-224057

Chicago Style (17th ed.) Citation

Chun, Wei, Haiyan Shi, Baoliang Liu, Zhiqiang Zhang, and Yanqing Wen. "Reliability Analysis of Failure Threshold Value with Uncertain Liu Process." Journal of Intelligent & Fuzzy Systems 44, no. 6 (2023): 9757. https://doi.org/10.3233/JIFS-224057.

MLA (9th ed.) Citation

Chun, Wei, et al. "Reliability Analysis of Failure Threshold Value with Uncertain Liu Process." Journal of Intelligent & Fuzzy Systems, vol. 44, no. 6, 2023, p. 9757, https://doi.org/10.3233/JIFS-224057.