Research on Fabric Defect Detection Technology Based on EDSR and Improved Faster RCNN
In order to solve the problems of various kinds of defects, defect ratio varies greatly, imbalanced defect aspect ratio and high integration degree with background in fabric defect detection, a method combining super-resolution reconstruction technology and deep learning detection was proposed. Firs...
Saved in:
Published in | Knowledge Science, Engineering and Management Vol. 13370; pp. 477 - 488 |
---|---|
Main Authors | , , , |
Format | Book Chapter |
Language | English |
Published |
Switzerland
Springer International Publishing AG
2022
Springer International Publishing |
Series | Lecture Notes in Computer Science |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | In order to solve the problems of various kinds of defects, defect ratio varies greatly, imbalanced defect aspect ratio and high integration degree with background in fabric defect detection, a method combining super-resolution reconstruction technology and deep learning detection was proposed. Firstly, the enhanced deep residual networks for single image super-resolution is used to enrich the defect feature information, reduce the fusion degree of defect and background texture, and enhance the extraction ability of various defect features. Then, the defect features are analyzed according to K-means clustering algorithm. Based on the three default anchor frame ratios provided by Faster RCNN, six new types of anchor ratios are added. Then, FPN module and DCNv2 module were introduced in Faster RCNN to improve the ability to identify defects with different areas and shapes. Finally, the pooling mode of ROI layer was modified to eliminate the error caused by quantization operation. The results of the three kinds of comparative experiments show that the method based on EDSR and improved Faster RCNN has a better overall recognition rate for multiple kinds of fabric defects than other current methods, and can be used in the production and operation of textile enterprises. |
---|---|
AbstractList | In order to solve the problems of various kinds of defects, defect ratio varies greatly, imbalanced defect aspect ratio and high integration degree with background in fabric defect detection, a method combining super-resolution reconstruction technology and deep learning detection was proposed. Firstly, the enhanced deep residual networks for single image super-resolution is used to enrich the defect feature information, reduce the fusion degree of defect and background texture, and enhance the extraction ability of various defect features. Then, the defect features are analyzed according to K-means clustering algorithm. Based on the three default anchor frame ratios provided by Faster RCNN, six new types of anchor ratios are added. Then, FPN module and DCNv2 module were introduced in Faster RCNN to improve the ability to identify defects with different areas and shapes. Finally, the pooling mode of ROI layer was modified to eliminate the error caused by quantization operation. The results of the three kinds of comparative experiments show that the method based on EDSR and improved Faster RCNN has a better overall recognition rate for multiple kinds of fabric defects than other current methods, and can be used in the production and operation of textile enterprises. |
Author | Zhang, Naigang Yao, Li Wan, Yan Gao, Ao |
Author_xml | – sequence: 1 givenname: Li surname: Yao fullname: Yao, Li – sequence: 2 givenname: Naigang surname: Zhang fullname: Zhang, Naigang – sequence: 3 givenname: Ao surname: Gao fullname: Gao, Ao – sequence: 4 givenname: Yan surname: Wan fullname: Wan, Yan email: winniewan@dhu.edu.cn |
BookMark | eNo1kN1OwkAQhVdFIyBv4EVfYHW2s92fS-VHSQgmiIl3m227BRRb7FYT34Zn4clcQDMXJzkzZzLzdUirrEpHyDWDGwYgb7VUFCkgowy00lQZVCekF2wM5sFTp6TNBGMUkesz0vlvKGiRNiDEVEuOF6TDEIVOMFH8kvS8fwOAWGKcSGyT15nzztbZMqrK3XZk03qVRQNXuKwJ0gRZVWU0d9myrNbV4ie6t97lh-Hh4HkW2TLfbccfm7r6DvbI-sbV0aw_nV6R88Kuvev9aZe8jIbz_iOdPD2M-3cTumESGypQZVKmIFFjDLkQQnJIU44yvCZ1wZTLuFAq54ViaZ6KxOacJxY0CyUL7JL4uNdv6lW5cLVJq-rdGwZmD9IEYgZNQGMO0MweZAjxYyjc_fnlfGPcPpW5sqntOlvaTXjDGwlcJDo2iUgM14i_SmpzPw |
ContentType | Book Chapter |
Copyright | The Author(s), under exclusive license to Springer Nature Switzerland AG 2022 |
Copyright_xml | – notice: The Author(s), under exclusive license to Springer Nature Switzerland AG 2022 |
DBID | FFUUA |
DEWEY | 006.33 |
DOI | 10.1007/978-3-031-10989-8_38 |
DatabaseName | ProQuest Ebook Central - Book Chapters - Demo use only |
DatabaseTitleList | |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Computer Science |
EISBN | 9783031109898 3031109899 |
EISSN | 1611-3349 |
Editor | Yang, Baijian Qiu, Meikang Memmi, Gerard Zhang, Tianwei Kong, Linghe |
Editor_xml | – sequence: 1 fullname: Yang, Baijian – sequence: 1 givenname: Gerard surname: Memmi fullname: Memmi, Gerard email: gerard.memmi@telecom-paris.fr – sequence: 2 fullname: Qiu, Meikang – sequence: 2 givenname: Baijian surname: Yang fullname: Yang, Baijian email: byang@purdue.edu – sequence: 3 fullname: Kong, Linghe – sequence: 3 givenname: Linghe surname: Kong fullname: Kong, Linghe email: linghe.kong@sjtu.edu.cn – sequence: 4 fullname: Memmi, Gerard – sequence: 4 givenname: Tianwei surname: Zhang fullname: Zhang, Tianwei email: tianwei.zhang@ntu.edu.sg – sequence: 5 fullname: Zhang, Tianwei – sequence: 5 givenname: Meikang orcidid: 0000-0002-1004-0140 surname: Qiu fullname: Qiu, Meikang email: qiumeikang@ieee.org |
EndPage | 488 |
ExternalDocumentID | EBC7046592_565_493 |
GroupedDBID | 38. AABBV AALIB AAZWU ABSVR ABTHU ABVND ACBPT ACHZO ACPMC ADNVS AEDXK AEJLV AEKFX AHVRR ALMA_UNASSIGNED_HOLDINGS BBABE CZZ FFUUA IEZ SBO TPJZQ TSXQS Z5O Z7R Z7S Z7U Z7V Z7W Z7X Z7Y Z7Z Z81 Z82 Z83 Z84 Z87 Z88 -DT -GH -~X 1SB 29L 2HA 2HV 5QI 875 AASHB ABMNI ACGFS ADCXD AEFIE EJD F5P FEDTE HVGLF LAS LDH P2P RIG RNI RSU SVGTG VI1 ~02 |
ID | FETCH-LOGICAL-p173t-638c77b0739320d666740bb43716179f18ec4688d4f81bdb65ad445a0919197f3 |
ISBN | 3031109880 9783031109881 |
ISSN | 0302-9743 |
IngestDate | Wed Nov 06 06:40:14 EST 2024 Thu Jul 25 22:20:26 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
LCCallNum | Q334-342 |
Language | English |
LinkModel | OpenURL |
MergedId | FETCHMERGED-LOGICAL-p173t-638c77b0739320d666740bb43716179f18ec4688d4f81bdb65ad445a0919197f3 |
OCLC | 1336953584 |
PQID | EBC7046592_565_493 |
PageCount | 12 |
ParticipantIDs | springer_books_10_1007_978_3_031_10989_8_38 proquest_ebookcentralchapters_7046592_565_493 |
PublicationCentury | 2000 |
PublicationDate | 2022 |
PublicationDateYYYYMMDD | 2022-01-01 |
PublicationDate_xml | – year: 2022 text: 2022 |
PublicationDecade | 2020 |
PublicationPlace | Switzerland |
PublicationPlace_xml | – name: Switzerland – name: Cham |
PublicationSeriesSubtitle | Lecture Notes in Artificial Intelligence |
PublicationSeriesTitle | Lecture Notes in Computer Science |
PublicationSeriesTitleAlternate | Lect.Notes Computer |
PublicationSubtitle | 15th International Conference, KSEM 2022, Singapore, August 6-8, 2022, Proceedings, Part III |
PublicationTitle | Knowledge Science, Engineering and Management |
PublicationYear | 2022 |
Publisher | Springer International Publishing AG Springer International Publishing |
Publisher_xml | – name: Springer International Publishing AG – name: Springer International Publishing |
RelatedPersons | Hartmanis, Juris Gao, Wen Steffen, Bernhard Bertino, Elisa Goos, Gerhard Yung, Moti |
RelatedPersons_xml | – sequence: 1 givenname: Gerhard surname: Goos fullname: Goos, Gerhard – sequence: 2 givenname: Juris surname: Hartmanis fullname: Hartmanis, Juris – sequence: 3 givenname: Elisa surname: Bertino fullname: Bertino, Elisa – sequence: 4 givenname: Wen surname: Gao fullname: Gao, Wen – sequence: 5 givenname: Bernhard orcidid: 0000-0001-9619-1558 surname: Steffen fullname: Steffen, Bernhard – sequence: 6 givenname: Moti orcidid: 0000-0003-0848-0873 surname: Yung fullname: Yung, Moti |
SSID | ssj0002732573 ssj0002792 |
Score | 2.0777075 |
Snippet | In order to solve the problems of various kinds of defects, defect ratio varies greatly, imbalanced defect aspect ratio and high integration degree with... |
SourceID | springer proquest |
SourceType | Publisher |
StartPage | 477 |
SubjectTerms | EDSR Fabric defect detection Faster RCNN |
Title | Research on Fabric Defect Detection Technology Based on EDSR and Improved Faster RCNN |
URI | http://ebookcentral.proquest.com/lib/SITE_ID/reader.action?docID=7046592&ppg=493 http://link.springer.com/10.1007/978-3-031-10989-8_38 |
Volume | 13370 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1Lb9QwELZouSAOlJcoUOQDnFZBSeysk-N2H61a2ENp0d6sOHGO24qGC7-mv6W_jM-vZBN6KVop2mTtrOXPGc9MZr4h5LOqU6YzpSIViwoGCh7FPBNlpKfYjSCTWVwaQ_H7enp6xc822SbUavfZJa36Wv15MK_kf1DFNeBqsmQfgWx3U1zAd-CLIxDGcaT8Dt2sFuDz4A0Lz6cVaz29oA-hGEa3eCZuH243gd43T7_M4lWpTET9Qlsq44Vutasg3jveJ8fY7uquw3Lx48L8gTtzngn8vCoN78LkYr5e77oT0nTkTgjuxJFDcscnNjsZmKDYAg1pae4Kr3QylTFXD-QfCb0blIGukelbRLl0HC9DQmzuiieOCLGXx3MBqz4rUgltVKLRHtkTBcTb09ny7NvPzsUGzQwCyVTy6AbpWb76Qe9kUz40poHdMXpVbjWQywPy3GSlUJMuglG-JE_09hV5EWpyUL8EXpNNwJZeb-_vHK7U4Uo7XGmPK7W42sYGUwpM7-8CntThSQ2eb8jVank5P4189YzoJhGsjSBYKyGUpTxM4xpmquCxUpwJY9IWTZLrik_zvOYNTJdaTbOy5jwroUDiIxr2luxvr7f6HaHQApnidZGUquCYOJVzVVes4UI1PBHJIYnCLEn7jt8HFlduTm7lCK9DMglTKU3zWxnIs4GBZBIYSIuBNBi8f-TdP5Bn_cL-SPbbX7_1ETTHVn3yK-QvLsdnGg |
link.rule.ids | 782,783,787,796,27938 |
linkProvider | Library Specific Holdings |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=bookitem&rft.title=Knowledge+Science%2C+Engineering+and+Management&rft.atitle=Research+on%C2%A0Fabric+Defect+Detection+Technology+Based+on%C2%A0EDSR+and%C2%A0Improved+Faster+RCNN&rft.date=2022-01-01&rft.pub=Springer+International+Publishing+AG&rft.isbn=9783031109881&rft.volume=13370&rft_id=info:doi/10.1007%2F978-3-031-10989-8_38&rft.externalDBID=493&rft.externalDocID=EBC7046592_565_493 |
thumbnail_s | http://utb.summon.serialssolutions.com/2.0.0/image/custom?url=https%3A%2F%2Febookcentral.proquest.com%2Fcovers%2F7046592-l.jpg |