Comparison between dark and illuminated annealing of compensated and uncompensated mc-Si wafers - Wyller, Guro Marie; Wiig, Marie Syre; Thomassen, Bent; Søndenå, Rune (AIP conference proceedings, 2022)
Keywords: Annealing; Carrier lifetime; Compensation; Degradation; Electrical resistivity; High temperature; Minority carriers; Regeneration; Silicon; Silicon wafers; Wafers