Daniel, C., Mucklich, F., Mueller, J., Rehbein, P., & Haas, V. (2003). Characterization of Periodic Micro-/Nano-Patterns for Wear Minimization of Electrical Contacts. Praktische Metallographie, 40(8), 377-386.
Chicago Style (17th ed.) CitationDaniel, C., F. Mucklich, J. Mueller, P. Rehbein, and V. Haas. "Characterization of Periodic Micro-/Nano-Patterns for Wear Minimization of Electrical Contacts." Praktische Metallographie 40, no. 8 (2003): 377-386.
MLA (9th ed.) CitationDaniel, C., et al. "Characterization of Periodic Micro-/Nano-Patterns for Wear Minimization of Electrical Contacts." Praktische Metallographie, vol. 40, no. 8, 2003, pp. 377-386.
Warning: These citations may not always be 100% accurate.