Time-Interleaved and Circuit-Shared Dual-Channel 10 b 200 MS/s 0.18 μm CMOS Analog-to-Digital Convertor

• Published in: IEEE transactions on very large scale integration (VLSI) systems Vol. 21; no. 12; pp. 2206 - 2213
• Main Authors: KIM, Hyo-Jin, AN, Tai-Ji, MYUNG, Sung-Meen, LEE, Seung-Hoon
• Format: Journal Article
• Language: English
• Published: New York, NY Institute of Electrical and Electronics Engineers 01.12.2013
• Subjects: Amplifiers; Applied sciences; Circuit properties; Circuits of signal characteristics conditioning (including delay circuits); Design. Technologies. Operation analysis. Testing; Electric, optical and optoelectronic circuits; Electronic circuits; Electronics; Exact sciences and technology; Integrated circuits; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Signal convertors; Sample and hold circuit; Prototype; Input signal; Differential amplifier; Clock; Analog converter; AD converter; Wide band; Complementary MOS technology; Electric power consumption; dualchannel; Selector switch; Sampling; time-interleaved; Dynamic response; Low-jitter circuit; Operational amplifier; Dynamic characteristic; Two channel system; Analog-to-digital converter (ADC); AD conversion; DA converter; Mismatching; Switching; pipeline; Gain; Time interleaving; circuit sharing; channel mismatch
• ISSN: 1063-8210; 1557-9999
• DOI: 10.1109/TVLSI.2012.2229305