X-RAY REFLECTED SPECTRA FROM ACCRETION DISK MODELS. III. A COMPLETE GRID OF IONIZED REFLECTION CALCULATIONS

We present a new and complete library of synthetic spectra for modeling the component of emission that is reflected from an illuminated accretion disk. The spectra were computed using an updated version of our code xillver that incorporates new routines and a richer atomic database. We offer in the...

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Published inThe Astrophysical journal Vol. 768; no. 2; pp. 1 - 20
Main Authors Garcia, J, Dauser, T, Reynolds, C S, Kallman, T R, McClintock, J E, Wilms, J, Eikmann, W
Format Journal Article
LanguageEnglish
Published United States 10.05.2013
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Summary:We present a new and complete library of synthetic spectra for modeling the component of emission that is reflected from an illuminated accretion disk. The spectra were computed using an updated version of our code xillver that incorporates new routines and a richer atomic database. We offer in the form of a table model an extensive grid of reflection models that cover a wide range of parameters. Each individual model is characterized by the photon index F of the illuminating radiation, the ionization parameter [xi] at the surface of the disk (i.e., the ratio of the X-ray flux to the gas density), and the iron abundance A sub(Fe) relative to the solar value. The ranges of the parameters covered are 1.2 [< or =, slant] [Gamma] [< or =, slant] 3.4, 1 [< or =, slant] [xi] [< or =, slant] 10 super(4), and 0.5 [< or =, slant] A sub(Fe) [< or =, slant] 10. These ranges capture the physical conditions typically inferred from observations of active galactic nuclei, and also stellar-mass black holes in the hard state. This library is intended for use when the thermal disk flux is faint compared to the incident power-law flux. The models are expected to provide an accurate description of the Fe K emission line, which is the crucial spectral feature used to measure black hole spin. A total of 720 reflection spectra are provided in a single FITS file (http://hea-www.cfa.harvard.edu/~javier/xillver/) suitable for the analysis of X-ray observations via the atable model in XSPEC. Detailed comparisons with previous reflection models illustrate the improvements incorporated in this version of XILLVER.
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ISSN:0004-637X
1538-4357
DOI:10.1088/0004-637X/768/2/146