Jiquan, G., Tantawi, S., Martin, D., & Yoneda, C. (2010). Cryogenic RF Material Testing with a High-Q Copper Cavity. AIP conference proceedings, 1299(1), . https://doi.org/10.1063/1.3520338
Chicago Style (17th ed.) CitationJiquan, Guo, Sami Tantawi, David Martin, and Charles Yoneda. "Cryogenic RF Material Testing with a High-Q Copper Cavity." AIP Conference Proceedings 1299, no. 1 (2010). https://doi.org/10.1063/1.3520338.
MLA (9th ed.) CitationJiquan, Guo, et al. "Cryogenic RF Material Testing with a High-Q Copper Cavity." AIP Conference Proceedings, vol. 1299, no. 1, 2010, https://doi.org/10.1063/1.3520338.
Warning: These citations may not always be 100% accurate.