Investigation on the Structure of Evaporated Nickel Film by Electron Diffraction Method

Crystal structure of thin nickel films deposited on glass surface under various conditions is investigated by means of electron diffraction. When the base temperature is below about 100m°C in high vacuum, the orientation of (110) plane parallel to the base surface becomes noticeable with increasing...

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Published inOyo Buturi Vol. 25; no. 4; pp. 164 - 169
Main Authors ONO, Kazumasa, ODA, Zenjiro
Format Journal Article
LanguageEnglish
Japanese
Published The Japan Society of Applied Physics 10.04.1956
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Abstract Crystal structure of thin nickel films deposited on glass surface under various conditions is investigated by means of electron diffraction. When the base temperature is below about 100m°C in high vacuum, the orientation of (110) plane parallel to the base surface becomes noticeable with increasing thickness of the film. Presence of argon gas (0.5 to 2.OmmHg) also increases the degree of (110) orientation. How-ever, variation of the base temperature and further addition of argon gas give rise to orientations other than (110). Beeck's conclusion that a conspicuously oriented nickel film with (110) plane parallel to the base surface has the (110) plane exposed on its surface is not supported by this work.
AbstractList Crystal structure of thin nickel films deposited on glass surface under various conditions is investigated by means of electron diffraction. When the base temperature is below about 100m°C in high vacuum, the orientation of (110) plane parallel to the base surface becomes noticeable with increasing thickness of the film. Presence of argon gas (0.5 to 2.OmmHg) also increases the degree of (110) orientation. How-ever, variation of the base temperature and further addition of argon gas give rise to orientations other than (110). Beeck's conclusion that a conspicuously oriented nickel film with (110) plane parallel to the base surface has the (110) plane exposed on its surface is not supported by this work.
Author ONO, Kazumasa
ODA, Zenjiro
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References 4) W.M.H. Sachtler et al.: Extrait du J. de chimie Phys. 51, No 9, 491 (1954
2) A. G. Quarrell: Proc. Phys. Soc. 49, 279 (1937
1) G.I. Finch, A.W. Ikin: Proc. Roy. Soc. A 145, 551 (1934
3) O. Beeck, A. E. Smith and A. Wheeler: Proc. Roy. Soc. 177, 62 (1940
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Snippet Crystal structure of thin nickel films deposited on glass surface under various conditions is investigated by means of electron diffraction. When the base...
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Title Investigation on the Structure of Evaporated Nickel Film by Electron Diffraction Method
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