電子エネルギー損失分光法による化学結合状態分析

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Published in軽金属 Vol. 63; no. 12; pp. 466 - 473
Main Author 倉田, 博基
Format Journal Article
LanguageJapanese
Published 一般社団法人 軽金属学会 30.12.2013
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Author 倉田, 博基
Author_xml – sequence: 1
  fullname: 倉田, 博基
  organization: 京都大学 化学研究所 先端ビームナノ科学センター 複合ナノ解析化学研究領域
BookMark eNo9UD1Lw0AAPaSCtXbyd6Ted-4mkVI_oOCic7hcoiakVZIujrZUamshiy6Ck4ggFUR00X9zXIr_whTF5T14X8NbBZXuaTcEYB3BBqacbsRR0mlw0qCcL4EqEgI6AiJRAVVIGXKYlHQF1LMs8iGG1MWSoSpofd992llu-k9mMDWDZ9N_MYOvIp_ah1c7urTDq-LtxlyU-sj0J_b61s4e5--5zUfz8UcxnJSZ4j5fA8tHKsnC-h_XwOF266C567T3d_aaW20nxphAJ6CKBVoJDYVgPne58DknWGpFAhYQrZkKQiwQhq7EAaZChmVB-BK5SnKGSQ1s_u7GWU8dh95ZGnVUeu6ptBfpJPQWF3iceAgvsDzi39EnKvViRX4AuitvyQ
ContentType Journal Article
Copyright 2021 一般社団法人軽金属学会
Copyright_xml – notice: 2021 一般社団法人軽金属学会
DOI 10.2464/jilm.63.466
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1880-8018
EndPage 473
ExternalDocumentID article_jilm_63_12_63_466_article_char_ja
GroupedDBID -~X
2WC
5GY
ACIWK
ALMA_UNASSIGNED_HOLDINGS
CS3
JSF
KQ8
OK1
RJT
~02
ID FETCH-LOGICAL-j2230-d4a5dca8c0885b6768b66329ca3d5d3cc5ade28120792d2489ea5d8b917a96523
ISSN 0451-5994
IngestDate Wed Apr 05 07:03:42 EDT 2023
IsDoiOpenAccess true
IsOpenAccess true
IsPeerReviewed false
IsScholarly true
Issue 12
Language Japanese
LinkModel OpenURL
MergedId FETCHMERGED-LOGICAL-j2230-d4a5dca8c0885b6768b66329ca3d5d3cc5ade28120792d2489ea5d8b917a96523
OpenAccessLink https://www.jstage.jst.go.jp/article/jilm/63/12/63_466/_article/-char/ja
PageCount 8
ParticipantIDs jstage_primary_article_jilm_63_12_63_466_article_char_ja
PublicationCentury 2000
PublicationDate 2013/12/30
PublicationDateYYYYMMDD 2013-12-30
PublicationDate_xml – month: 12
  year: 2013
  text: 2013/12/30
  day: 30
PublicationDecade 2010
PublicationTitle 軽金属
PublicationTitleAlternate 軽金属
PublicationYear 2013
Publisher 一般社団法人 軽金属学会
Publisher_xml – name: 一般社団法人 軽金属学会
References 2) S. J. Pennycook and P. D. Nellist: Scanning Transmission Electron Microscopy, Springer, (2011).
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1) P. W. Hawkes: Advances in Imaging and Electron Physics, Vol. 153 Aberration-Corrected Electron Microscopy, Elsevier, (2008).
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References_xml
SSID ssib020472951
ssib005901859
ssib025353017
ssib006287580
ssj0044477
ssib002484476
ssib000961639
Score 2.0272024
SourceID jstage
SourceType Publisher
StartPage 466
Title 電子エネルギー損失分光法による化学結合状態分析
URI https://www.jstage.jst.go.jp/article/jilm/63/12/63_466/_article/-char/ja
Volume 63
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
ispartofPNX 軽金属, 2013/12/30, Vol.63(12), pp.466-473
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnR1Na9RANNR60YP4id_04Jwka5L5yMwx2U0pioLQQm8hXwsuWkW2F2_uUlmthb3oRfAkIkgFEb3ovwnZ4r_wvUmyHUWkFsLwmJn35s17k3lvJnkzlnUNrJ7v9uEFBFvj2awvuJ36mWNzDMRMCtH3CwwUvn1HrKyxm-t8feGIMP5a2hymnezJX-NKDqNVyAO9YpTsf2h2ThQyAAb9QgoahvRAOiaRIiokYUgiToIeUQ6JKJEeCaQG4Ok1QBC2RVGTE3ZJJBAF6wA6I6GLgJRECg3Ao7BOSIniGsvdpyNlC-jWZZco0bARAOCTkGt-dIqVfSIDEgokiJRDoy1gIyL1fZ6to0wiif0Ke9hH6ROleQMO1Tx0QhNwNI9QDuw7OF50Logi0E0vk2YjotnYcKk-PtGZD0USAaJEOtAgsBN0kRoKI9IEQhJQQwaQD50Irv-DPUMIDIWsAmOyZdy1uaovXO4UtTGAuQ0tuDStRTMdN2-FZ8z9TAjDjWD1DS1_WiiPCYYW6t79Bx1BO3Oc3478bgZUjLViQWPXwxTqxm0JhuTFA1gXHPV8xXHT4dZdw61WAtxs0-2VjBluJ8YbS8ONFbBsNr6Ge3iCqNr_WuxxysEOzDcyGBDTxxC0MqvjXrFrN4yOgU83gBVO-3ekdthWT1onmpXWUlD35ZS1MEhOW8eN8zfPWNHPN9-r3Wk5-lCOd8rxx3L0qRz_mE13qnefq8mzauv57Mur8inkT8rRdvXydbX7fu_rtJpO9l58m21tQ53Z2-lZa205Wu2u2M29IvYAnGHHzlnC8yyRGVhYngpYcKfgd3sqS2jOc5plPMkLDzxfx1deDsJTBSDIVLl-ogT36DlrcePhRnHeWuJCOf0ioxKmQkYz0AXNZZ46EvecFM0uWLKWQfyoPjwmPrBuLx4e9ZJ1bP-FumwtDh9vFlfAdx6mV_VA-QVlX6Cb
link.rule.ids 315,786,790,27957,27958
linkProvider Colorado Alliance of Research Libraries
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=%E9%9B%BB%E5%AD%90%E3%82%A8%E3%83%8D%E3%83%AB%E3%82%AE%E3%83%BC%E6%90%8D%E5%A4%B1%E5%88%86%E5%85%89%E6%B3%95%E3%81%AB%E3%82%88%E3%82%8B%E5%8C%96%E5%AD%A6%E7%B5%90%E5%90%88%E7%8A%B6%E6%85%8B%E5%88%86%E6%9E%90&rft.jtitle=%E8%BB%BD%E9%87%91%E5%B1%9E&rft.au=%E5%80%89%E7%94%B0%2C+%E5%8D%9A%E5%9F%BA&rft.date=2013-12-30&rft.pub=%E4%B8%80%E8%88%AC%E7%A4%BE%E5%9B%A3%E6%B3%95%E4%BA%BA+%E8%BB%BD%E9%87%91%E5%B1%9E%E5%AD%A6%E4%BC%9A&rft.issn=0451-5994&rft.eissn=1880-8018&rft.volume=63&rft.issue=12&rft.spage=466&rft.epage=473&rft_id=info:doi/10.2464%2Fjilm.63.466&rft.externalDocID=article_jilm_63_12_63_466_article_char_ja
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0451-5994&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0451-5994&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0451-5994&client=summon