Intrinsic defect structures of polycrystalline CaKFe4As4 superconductors

• Published in: Physical chemistry chemical physics : PCCP Vol. 23; no. 35; pp. 19827 - 19833
• Main Authors: Pavan Kumar Naik Sugali, Ishida, Shigeyuki, Kimoto, Koji, Yanagisawa, Keiichi, Kamiya, Yoshihisa, Tsuchiya, Yoshinori, Kawashima, Kenji, Yoshida, Yoshiyuki, Iyo, Akira, Eisaki, Hiroshi, Nishio, Taichiro, Ogino, Hiraku
• Format: Journal Article
• Language: English
• Published: Cambridge Royal Society of Chemistry 01.01.2021
• Subjects: Critical current density; Crystal defects; Crystal structure; Crystallinity; Defects; Fourier transforms; Polycrystals; Scanning transmission electron microscopy; Stacking faults; Stress distribution; Superconductors

We investigated the defect structures of polycrystalline CaKFe4As4 (CaK1144) superconductors by scanning transmission electron microscopy (STEM). The STEM studies revealed the presence of a one-layer CaFe2As2 (∼1 nm size) defect along the ab-plane, as observed in single crystalline CaK1144. Step-lik...