STEMと電子線トモグラフィーの出会い
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| Published in | 顕微鏡 Vol. 44; no. 4; p. 240 |
|---|---|
| Main Authors | , |
| Format | Journal Article |
| Language | Japanese |
| Published |
公益社団法人 日本顕微鏡学会
30.12.2009
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| Subjects | |
| Online Access | Get full text |
| ISSN | 1349-0958 2434-2386 |
| DOI | 10.11410/kenbikyo.44.4_240 |
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| Author | 青山, 一弘 宮澤, 淳夫 |
|---|---|
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| SubjectTerms | CEMOVIS：Cryo-Electron Microscopy Of Vitreous Sections ET：電子線トモグラフィー STEM：走査透過型電子顕微鏡 TOVIS：Tomography Of Vitreous Sections クライオ電子顕微鏡法 |
| Title | STEMと電子線トモグラフィーの出会い |
| URI | https://www.jstage.jst.go.jp/article/kenbikyo/44/4/44_240/_article/-char/ja |
| Volume | 44 |
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